Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

Comprehending failure modes, mechanisms, and root causes is vital in the production of semiconductors and electronic devices. Pinpointing the primary cause of failure is key to preventing its ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

The AFM market is buoyed by demands in semiconductor miniaturization and nanotechnology research, requiring precise metrology solutions. Growth opportunities lie in automated AFM systems for yield ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

An intelligent AFM processing framework integrates optimized scanning trajectories, distortion correction, and deep learning segmentation to improve imaging stability, accuracy, and automation. By ...

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

Researchers at Nano Life Science Institute (WPI-NanoLSI), Kanazawa University report in Small Methods the 3D imaging of a suspended nanostructure. The technique used is an extension of atomic force ...

AFM can identify unique nanomechanical fingerprints in pulmonary fibrosis, aiding in diagnosis, staging, and monitoring treatment efficacy. Current PF treatment efficacy varies due to challenges in ...

In recent years, ways to extend the method to three-dimensional (3D) imaging have been explored, with researchers from Nano Life Science Institute (WPI-NanoLSI), Kanazawa University reporting ...