Introduction and overview of Fourier descriptors / Pete E. Lestrel -- Growth and form revisited / Dwight W. Read -- Methodological issues in the description of forms / Paul O'Higgins -- Phase angles, ...
There are many books and articles on the Fourier Transform and its implementation available. A quick survey of these resources shows that they are not geared to the needs of the “Practicing ...
The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
What is CTL, and why is it important to the semiconductor industry? The answers are here. Although the IEEE 1450.0 Stand-ard Test Interface Language (STIL) was adopted in March 1999, widespread ...