Twin defects introduced into copper grains cause the slowing of atomic migration along the grain boundary under current-induced conditions. In polycrystalline solids, the grain boundary regions are ...
Copyright AD-TECH; licensee AZoM.com Pty Ltd. This is an AZo Open Access Rewards System (AZo-OARS) article distributed under the terms of the AZo–OARS https://www ...
The Nano Materials Research Division at the Korea Institute of Materials Science (KIMS), led by Dr. Tae-Hoon Kim and Dr. Jung-Goo Lee, has successfully developed a groundbreaking grain boundary ...
SIMS imaging of lithium-ion migration within a solid electrolyte specimen. Grain boundaries resistant to ionic diffusion have created an uneven 6 Li distribution. Quantitative analysis found that ...
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