Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

How a small molecule offers a new window into atomic-scale magnetism. (Nanowerk News) A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Scientists use scanning tunneling microscopy to understand how a material's electronic or magnetic properties relate to its structure on the atomic scale. When using this technique, however, they can ...

A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...

Go to the Mode Master. Select Offline Image. Click Browse in the AR Load Path Window to locate the directory you wish to use. If you were just imaging, the images you took during this session should ...