A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

SAN FRANCISCO -- Intel Corp. said Wednesday that it has redesigned the electronic switches on its chips so that computers can keep getting cheaper and more powerful. The switches, known as transistors ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

For almost two decades, scientists have been trying to move beyond silicon, the material ...

A single electron makes the difference between “on” and “off” for a new transistor made from a single carbon nanotube, whose minute size and low-energy requirements should make it an ideal device for ...

On Oct. 3, 1950, three scientists at Bell Labs in New Jersey received a U.S. patent for what would become one of the most important inventions of the 20th century — the transistor. John Bardeen, ...