Abstract: As new applications for non-volatile memory (NVM) continue to grow, scalable testing platforms are needed to evaluate new materials and devices. To address this a Memory Test Vehicle (MTV) ...
Abstract: High-speed wafer testing is a difficult problem in the automated mass production testing of integrated circuits. A vertical probe card for high-speed wafer test is designed in this paper.
August 2024: We’ve updated this guide to note the recently released 1TB models for three of our top picks: the Samsung Pro Plus, the Kingston Canvas Go Plus and the Samsung Evo Select. We’ve also made ...
A lightweight, memory-efficient, non-blocking software timer library designed for embedded systems and real-time applications. Built for Arduino, ESP32, Windows, Linux, and any embedded platform ...
PCWorld demonstrates using Google’s Gemini AI to diagnose Plex Media Server issues through a systematic four-phase checkup ...
Arduino test code is run to see if the sensors are working properly, with built-in LED flashing when the sensor is triggered, and turning off when the sensor is released. The testing of the keys ...
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