Patch AM: Bomb threat under investigation at NJ college, police say

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IEEE

MLCAD: A Survey of Research in Machine Learning for CAD Keynote Paper

Abstract: Due to the increasing size of integrated circuits (ICs), their design and optimization phases (i.e., computer-aided design, CAD) grow increasingly complex. At design time, a large design ...

Patch AM: Have you seen a good deed in Lakewood? Tell us about it!

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