IEEE

Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training

Abstract: This paper presents the integration of several deep learning techniques for defect inspection of plated through-hole (PTH) on printed circuit boards (PCBs). In our proposed system, the ...
IEEE

Training a Dynamic Growing Mixture Model for Lifelong Learning

Abstract: Lifelong learning (LLL) defines a training paradigm that aims to continuously acquire and capture new concepts from a sequence of tasks without forgetting. Recently, dynamic expansion models ...