Abstract: This article presents a design-for-test (DFT) loopback scheme for testing the analog portion of a mixed-signal chip using an all- digital tester. In fact, the proposed approach is used to ...
Abstract: In 2009 IMS3TW we presented a “Development Platform” for prototyping new multi-GHz ATE [1,2,3]. At that time, a complete multi-channel 2.5 Gbps (per channel) test system was shown as the ...
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