The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction ...

Silent silicon defects may cause modern CPUs and GPUs to produce incorrect results without crashing, raising concerns about data integrity in large-scale computing systems.

Quantum computers are alternative computing devices that process information, leveraging quantum mechanical effects, such as ...

As electronic products move from prototyping to mass production, manufacturers must rely on efficient, scalable, and ...

The shift to multi-die assemblies is forcing changes in how chips are tested and inspected in order to achieve sufficient yield ramp or respond more quickly to yield excursions.

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Abstract: Aiming at the problems of low detection accuracy and large model of most current printed circuit board (PCB) defect detection algorithms, which are not conducive to mobile deployment, an ...

The system, developed by Panevo, a Canadian clear technology and manufacturing analytics company, reportedly achieved approximately 97% detection reliability with minimal false positives of Muskoka’s ...