Agilent Technologies has announced a strategic partnership with Aster Technologies to enable integration of Aster's TestWay Coverage Analyst with Agilent's printed-circuit-board assembly-test ...
The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...
Integration enables companies to prepare designs and implement robust test strategies early in the PCB assembly manufacturing process, enabling earlier defect detection, reduced costs, accelerated ...
February 5, 2013. ASTER Technologies, a supplier of board-level testability and test-coverage analysis products, has developed a new release of TestWay in support of “Design for Excellence” (DfX) ...
The growth in safety-critical applications has ushered in a paradigm shift in automotive IC functional safety and test coverage analysis. The increased need for safety, low defect rate, and long-term ...
Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results