Ohio bill aims to ban A.I.-driven pricing algorithms that exploit competitor data

Bipartisan Ohio lawmakers are reviving an effort to regulate pricing algorithms, software that often uses artificial ...
IEEE

Enhanced Fault Detection in SRAM-Based FIFO Buffer using MARCH Test Algorithms for MBIST Architectures

In advanced semiconductor technology, it becomes more complex to grow in memory requirements and integrated circuits. To maintain a high performance and reliability of memory components in modern ...

Natural Gas News: Freeze-Offs & Inventory Depletion—Will March Futures Rally Continue?

February natural gas futures surged 70% on freeze-offs fears and a massive short squeeze. Will March continue the rally? Key technical levels revealed.
IEEE

Reduced March SR Algorithm for Deep-Submicron SRAM Testing

Abstract: Memory Built-In Self-Test (BIST) is a common method to test embedded memories on a chip owing to its fast and low-cost testing. Its efficiency depends on the complexity and the fault ...