Abstract: High-speed wafer testing is a difficult problem in the automated mass production testing of integrated circuits. A vertical probe card for high-speed wafer test is designed in this paper.

August 2024: We’ve updated this guide to note the recently released 1TB models for three of our top picks: the Samsung Pro Plus, the Kingston Canvas Go Plus and the Samsung Evo Select. We’ve also made ...

A lightweight, memory-efficient, non-blocking software timer library designed for embedded systems and real-time applications. Built for Arduino, ESP32, Windows, Linux, and any embedded platform ...

PCWorld demonstrates using Google’s Gemini AI to diagnose Plex Media Server issues through a systematic four-phase checkup ...

Arduino test code is run to see if the sensors are working properly, with built-in LED flashing when the sensor is triggered, and turning off when the sensor is released. The testing of the keys ...

In the 1970s, punch cards were used to run programs on room-sized computers. Credit: Madeleine Monroe/C&EN/Shutterstock Imagine a world without technology—no ...

Teradyne TER is benefiting from the growing demand for memory test solutions, particularly driven by advancements in AI applications and data center investments. In the third quarter of 2025, the ...

Candidates who have qualified the written examination can now check the city of their examination by logging into the official SSC website at ssc.gov.in The information has been made available through ...