Abstract: Electrical load profile (ELPs) analysis is an important foundation for data-driven decision-making, such as effective power system capacity planning and dynamic tariff development. However, ...

Owners with a modern ICE-based GM truck in their driveway may occasionally notice a message that reads “Heavy Fuel Use” in the driver information center. Understandably, a message like that could ...

As many market participants anticipate a year-end rally, there are mounting indications that such an outcome is far from assured. Investor positioning appears increasingly stretched, with multiple ...

(a) Scree plot. (b) Loading plot. (c) Dendrogram. (d) Score plot of observations across study areas. Through principal component and cluster analysis, the team examined data from topography, climate, ...

Dec 2 (Reuters) - Cloud infrastructure company Vultr said on Tuesday it would invest more than $1 billion to launch a new artificial intelligence cluster powered by Advanced Micro Devices' processors ...

Dr. James McCaffrey presents a complete end-to-end demonstration of anomaly detection using k-means data clustering, implemented with JavaScript. Compared to other anomaly detection techniques, ...

A Penn State University study has identified a skin cancer cluster in Central Pennsylvania linked to herbicides. Although Bucks County did not fall within the zone of Pennsylvania counties with the ...

The Israel Defense Forces (IDF) issued a short statement on December 24, 2007, on the results of an internal inquiry into its controversial use of cluster munitions during the 34-day war with ...

Introduction: Cardiogenic shock (CS) is a heterogeneous clinical syndrome, with varied clinical outcomes driven by hemodynamic states, and initial presentation. However, unsupervised machine learning ...

Abstract: Brushing is a common interaction technique in 2D scatterplots, allowing users to select clustered points within a continuous, enclosed region for further analysis or filtering. However, ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...