Abstract: Line edge roughness (LER) is an undesirable phenomenon that arises during semiconductor fabrication processes, causing fluctuations in the characteristics of semiconductor devices and ...
Airport runways seem pretty simple, just another strip of asphalt or concrete not unlike the roads that our cars drive upon every day. We can even use these same highways as landing strips in a ...
Abstract: This letter proposes a directivity-compensated wideband coupled-line-based microstrip coupler that incorporates capacitive-loading patches and reflectionless amplitude equalizers. Three tiny ...
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