Abstract: Line edge roughness (LER) is an undesirable phenomenon that arises during semiconductor fabrication processes, causing fluctuations in the characteristics of semiconductor devices and ...
Airport runways seem pretty simple, just another strip of asphalt or concrete not unlike the roads that our cars drive upon every day. We can even use these same highways as landing strips in a ...
Abstract: In this work, we present a numerical study of 1D and 2D closely spaced antenna arrays of microstrip dipole antennas covered by a metasurface in order to properly cloak and decouple the ...
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