IEEE

Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

Abstract: Performance benchmarks have been used over the years to compare different systems. These benchmarks can be useful for researchers trying to determine how changes to the technology, ...
IEEE

2.4 Gbps, 7 mW All-Digital PVT-Variation Tolerant True Random Number Generator for 45 nm CMOS High-Performance Microprocessors

Abstract: This paper describes an all-digital PVT-variation tolerant true-random number generator (TRNG), fabricated in 45 nm high-k/metal-gate CMOS, targeted for on-die entropy generation in ...