Silent silicon defects may cause modern CPUs and GPUs to produce incorrect results without crashing, raising concerns about data integrity in large-scale computing systems.
The Vajra-2020MRS 20MP AR2020 USB 3.2 Gen 2X2 UVC camera based on the Onsemi HyperLux™ LP AR2020 is intended for embedded vision systems that require high data throughput, low latency, and ...
The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction ...
An international research team used high-resolution electroluminescence imaging to quantify type-C cracks in 100 PV modules after 11 years of operation, linking crack distribution to real-world power ...
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