Semiconductor Engineering

Catching Critical Defects In TSVs And Stacked Chips

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
Edutopia

Pressure-Testing Your Tech-Integrated Lesson

Pressure-testing your lesson first helps catch friction points early and launch with confidence. Download the free checklist ...
IEEE

Deep Learning-Based Two-Step Denoising and Detection for MIMO-NOMA Under Imperfect Conditions

Abstract: Non-orthogonal multiple access (NOMA) has the potential to pave the way for next-generation wireless systems, especially when combined with multiple-input multiple-output (MIMO) technology.
IEEE

Multivariate Variable-Step Multiscale Extended Dispersion Entropy-Based Lempel–Ziv Complexity and Its Application in Fault Diagnosis

Abstract: Extended dispersion entropy-based Lempel–Ziv complexity (EDELZC) can measure the irregularity or chaos of single-channel time series, which is one of the ideal tools for extracting fault ...
Business Wire

Logical Intelligence Introduces First Energy-Based Reasoning AI Model, Signals Early Steps Toward AGI, Adds Yann LeCun and Patrick Hillmann to Leadership

SAN FRANCISCO--(BUSINESS WIRE)--Logical Intelligence, an artificial intelligence company developing energy-based (EBM) reasoning systems, today announced that Kona 1.0, its pioneering EBM for ...
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Learning how to transfer for beginners: 3 simple steps

Trump orders release of Arkansas congressman's son serving drug sentence China’s big people shortage just got bigger, and the risks are growing too At 80, Dolly Parton remains our most unlikely ...