Many things about diamonds seem eternal, including the many engineering problems related to making them work as a silicon ...

A technical paper titled “Test Generation for Subcircuits with High Functional Switching Activities” was published by Irith Pomeranz at Purdue University. Abstract “Chip aging results in defects that ...

Fraunhofer Institute for Photonic Microsystems IPMS has developed a new technology that makes pH measurements significantly ...

Reliability is now a system-level concern that includes everything from materials and packaging to testing with backside power.

Subsea technology and services company, SMD, has reached an important milestone with its pioneering electric work class ROV, the SMD Quantum EV. Site Acceptance Testing (SAT) at DEEP Campus, near ...

Abstract: The destructive testing for reliability analysis at high-power microwave (HPM) in the GaAs/InGaP hetero-junction bipolar transistor (HBT) has been rarely investigated although it has a ...

Intel has completed acceptance testing of the industry's first commercial high-NA EUV lithography system with a numerical aperture of 0.55, the ASML Twinscan EXE:5200B, laying the foundation for mass ...

In a paper presented at PCIM Nuremberg in June 20241, the authors propose a novel technique to enhance the heating power and thus shorten the heating time, through the inclusion of switching losses.

Bel Fuse-Circuit Protection has announced its 0680L Series of ceramic surface mount fuses with in-rush current withstand capability in a 2410 SMD package size. These slow blow fuses are designed for ...