Abstract: Deep learning-based surface defect detection shows significant promise for precision manufacturing. However, practical deployments are limited by challenges such as complex defect patterns, ...
The shift to multi-die assemblies is forcing changes in how chips are tested and inspected in order to achieve sufficient yield ramp or respond more quickly to yield excursions.
The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
Abstract: Nowadays, advanced technologies for semiconductor processing are rapidly increasing and leading to higher prospect of surface defects that must be promptly detected. The complex ...
The dataset is already organized in YOLO format in the steel_dataset/ directory. If you need to reorganize from original format, see utility/reorganize_dataset.py. steel-defect-detection/ ├── ...
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