Abstract: High-speed wafer testing is a difficult problem in the automated mass production testing of integrated circuits. A vertical probe card for high-speed wafer test is designed in this paper.

Compass Health Network was hit with an employment discrimination lawsuit on Dec. 2 in Missouri Circuit Court for Warren County. The action, over alleged age-based discrimination, was brought by the ...

The Ministry of Social Development and Innovation has launched ‘My eID’, a physical identity card with digital features. The card is currently available to Caymanians, who are encouraged to apply and ...

Compass Group and Delta Air Lines were slapped with an employment class action on Jan. 22 in California Superior Court for Los Angeles County. The lawsuit, brought by Employee Justice Legal Group, ...