Abstract: This paper presents a study on the PN junction reversed leakage current of zener diode attributed to the surface recombination, and the drift behavior after reliability stress. The leakage ...
Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60201, United States of America Article Views are the COUNTER-compliant sum of full text article downloads ...
Abstract: Resonant tunneling diode (RTD) technology is emerging as one of the promising semiconductor-based solid-state technologies for terahertz (THz) wireless communications. This article provides ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results